Smart Amplifiers ≲150nA
4 US Patents Issued & Proof of Silicon
Introducing the Smart Amplifier (sAMP) series: an innovative range of patented CMOS amplifiers optimized for ultra-low power consumption, low noise, and moderate-speed operation. Designed to run in an ultra-low-power (e.g., 100nA), low-noise mode during steady-state conditions, these amplifiers seamlessly switch to high-speed operation when sensors detect a change, making them ideal for ‘always-on’ smart IoT and near-sensor AI applications. These amplifiers are essential in diverse industries, from consumer electronics and medical devices to micro-robotics and drones.
The sAMP family specifically targets the ultra-low-power, low-cost market segment, catering to applications where continuous, efficient monitoring is critical. The sAMP family includes start-up and power-off mechanisms. It also has an internal buffer to drive larger loads (e.g., 10s of Mega Ωs) in a low-power system-on-chip (SoC) environment. Testing of specific performance metrics is ongoing, with results forthcoming. Summary of the sAMP family traits are as follows:
- Low-noise buffer-amplifier with near rail-to-rail input-output and (class AB) push-pull output stage
- Patented method enables lowering noise in steady-state by an order of magnitude under apples-to-apples IQ operating currents while boosting slew-rate and settling-time in the face of imbalanced inputs
- Topology retains inherent FCTA traits: optimal PSRR and CMRR, and fast slew-rate and settling-time considering ultra-low operating currents
- Requiring neither passive capacitors nor resistors, lowers silicon cost and facilitates operations in subthreshold at ultra-low current
- The sAMP input stage can be calibrated or trimmed to improve input offset voltage. Typical VOFFSET ≈ ±5mv
- Typical VDDHIGH ≈ 2v for 180nm & ≈1v for 65nm;
- Typical VINPUT & VOUTPUT swing from power supply rails ≈ ±50mv for 180nm and ≈ ±25mv for 65nm
- Equipped with start-up, and power-down
- Includes an internal buffer (BUF) to drive larger loads (e.g. Mega Ωs) in a SoC
- Operating in subthreshold and requiring no resistors facilitate small silicon area and operations at ultra-low currents
- Based on 180nm & 65nm digital CMOS at TSMC and portable to smaller fabrication nodes.









Smart Amplifier Family Table Summary
Proof of Silicon Preliminary Specifications (please see disclaimers)
Name | TSMC Fab Node | Cell Size (µm × µm) | IDD (nA) | Gain (dB) | PSRR (dB) | 10Hz VO Noise (μV/√Hz) | fu (KHz) | SR (v/ms) | ts (μs) |
---|---|---|---|---|---|---|---|---|---|
AMP1_1 | 180nm | 100 × 200 | 110 | 88 | 90 | 5 | 3 | 68 | <50 |
AMP1_2 | 180nm | 105 × 190 | 130 | 80 | 90 | 7 | 2 | 130 | <25 |
AMP1_3 | 180nm | 100 × 175 | 90 | 85 | 90 | 4 | 1 | 72 | <50 |
AMP3&4_1 | 180nm | 160 × 140 | 95 | 95 | 85 | 6 | 5 | 121 | <35 |
AMP3&4_2 | 180nm | 165 × 145 | 127 | 85 | 80 | 7 | 1 | 74 | <60 |
AMP2_0 | 65nm | 105 × 110 | 82 | 92 | 92 | 7 | 8 | 150 | <30 |
AMP2_1 | 65nm | 110 × 100 | 60 | 90 | 90 | 7 | 5 | 70 | <60 |
AMP2_2 | 65nm | 125 × 100 | 100 | 88 | 80 | 8 | 7 | 140 | <30 |
AMP2_3 | 65nm | 115 × 100 | 73 | 90 | 80 | 7 | 7 | 170 | <20 |
Notes: All sAMPs Fabricated in low-cost Digital CMOS. All sAMPs VOFFSET in the ~±5mV range without trim. Testing temperature ~ 27°C. External RLOAD utilized to increase quiescent current of sAMP buffer output in order to drive measurement gear load. Test condition for high VDD~2V for 180nm & VDD~1V for 65nm. Test conditions for low VDD~1.2V for 180nm & VDD~0.8V for 65nm. Temp test in progress. Gain and PSRR measured at higher frequencies and extrapolated back for gain at DC.